System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Test Switches
Series RT
Up to three Series FT switches can beassembled on various size 19" wide panels. One piece clear cover standardPanels available in choice of colors and materials
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Battery & Electrical System Testing
12-0200
Vehicle Battery Systems fitted to modern cars require a complex system to control and maintain the best charge and discharge rates which not only ensures the longest in service life but also that systems such as Stop/Start operate correctly. The 12-0200 gives the operator access to all the functions complicated and time-consuming manufacturer scan tools have to perform the same function but in a fraction of the time. On average the total time required by the technician to reset a system will be 30 seconds.
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HDT & Vicat Systems
The Instron line of CEAST Thermo-mechanical systems are used to characterize the behavior of plastic materials at high temperatures, measuring the heat deflection temperature (HDT) and the Vicat softening temperature (Vicat). These HDT and VICAT testers range from very simple units for quality control labs to more advanced and automated systems.
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12.5 mm Test Sphere Probe
CX-12.5
Shenzhen Chuangxin Instruments Co., Ltd.
The rigid sphere (12.5 mm) from Autostrong is designed and manufactured to perform the test specified in many standards (IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950) to prove the degree of protection for the first characteristic numerals 2 (IP2X) .Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.
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Data Acquisition System - 3U 5-Slot
DAQ-35CP0G
is a preconfigured rugged system ideally suited to support a multitude of military/aerospace data acquisition applications that require "SBC-less" remote Gig-E command and control of high-density, multichannel programmable ARINC 429/575; Dual-Redundant, Quad Channel MIL-STD-1553B; CANBus (CAN 2.0 A&B or J1939); A/D Conversion; RTD Measurement; RS-232/422/485 Serial Communications; Thermocouple Measurement; Discrete I/O; Differential Transceiver and Dual-Port Gig-E Ethernet.
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EMF Exposure Test
sXcTEM835
Tests radiofrequency electromagnetic field exposures from mobile communication devices operating in the 900 MHz region (additional frequencies upon request). The setup is based on two Crawford TEM cells that are blindly excited by a fully computer-controlled signal unit.
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Motion Systems
Choose from a variety of actuator stroke lengths and payloads. Know that our all-electric solutions offer an unprecedented level of fidelity and reliability with uptimes greater than 99.8% giving you greater usage and profitability.
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LCR METER/Transformer Test
A type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component.
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Motor Test for Stepping Motors
*Stable measurement: Since it uses Prony braking, this model provides stable measurement unaffected by moments of inertia and no coupling loss. In addition, the resulting measurements allow data correlation via the traditional double-balance method.*Precision measurement method: This model’s judgment of synchronization loss achieves high stability using algorithms developed by Sugawara Laboratories. Measurement mode can be chosen based on step angle. For pull-in torque, startup can be measured c...show more -
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Connector Test Tools
Yokowo Connector Test Tools - BtoB Clips, Interface Connectors, and Tools for FPC Connectors
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Compress Test Machine
JINAN PRCISION TESTING EQUIPMENT CO., LTD
A universal testing machine (UTM) specially configured to determine a material's strength and deformation behavior under compressive (pressing) load.
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Cable Identification System & Cable Phasing System
Impulse Phaser
With the introduction of direct buried, solid dielectric primary voltage cables, the IMPULSE PHASER has come into greater prominence for safely and accurately identifying buried primary cables, including jacketed neutral designs. The IMPULSE PHASER has been accurately used on paper insulated, lead covered feeders in excess of 20 miles and even on submarine cable 300 feet underwater.
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SMD Array Type LCR Test Fixture
16034H
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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High Voltage Test Set
Hi-Pot Series
SCOPE introduces a high voltage test set, these high voltage testing sets comes with Power frequency AC high voltage /DC high Voltage test /AC-DC high Voltage test set for testing transformers, motors, insulators, cables etc. Further, these testing sets are capable of giving continuously variable HIGH VOLTAGE from zero to maximum rated output voltage. Wide range of up to 100 kV is available in user selectable combinations.
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Laboratory Ozone Test Chamber
CX-150
Shenzhen Chuangxin Instruments Co., Ltd.
Laboratory Ozone Test chamber is widely used to control products quality in measuring quality control; Rubber & Plastics; automobile production; wire and cable; packing materials; instruments and meters; medical equipment; civilian nuclear energy; civil aviation; colleges and universities; research laboratories; inspection arbitration, and technical supervision departments and other rubber products.
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Wire Damage Test Device For Pull Testing
IEC60884 FIG11
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG11 Wire damage test device for pull testingThe wire damage test device is a special test instrument designed and manufactured according to the requirements of IEC884 Figure 11, , etc. It is mainly used to judge whether the screw-clamp type terminal is in design and structure.
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Signal Integrity Test Products
S1
*Fixtureless Test Solution*Automated Optical Inspection*DC Electrical test*Tests any backplane – Small, large, simple, complex*Now available with 4 heads
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Torque Metering System
Model RDT2100
The standard torque metering system that measures torque and rotational speed independently in a rotating coupling and calculates power. This includes dynamic/torsional torque measurement.
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Overhead Line & Cable Impedance Test Sets
T&R Test Equipment Overhead Line & Cable Impedance Test Sets
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Snap Button Pull Test Machine
UI-TX01
Snap Button Pull Test Machine is used to test pull strength of ornaments on garment, toy, footwear and others including button, bow and etc. Snap button pull test is a must-do test especially for Baby and children’s clothing and shoes. The test aims to use to button snap pull tester with suitable grips to pull the ornament to know if the ornament would be pulled off garment or not. The ornament falling off or broken button may cause infants or children the risk of ingestion. The button pull test methods includes 16CFR1500.51-53, ASTM PS79-96, ASTM F963, EN 71-1，M&S P115A and etc.
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Desktop Type AE Systems
Compared to the online remote AE systems, desktop type AE systems are connected to and accessible within the local network, either directly by wires or via wireless local networks. Such desktop type AE detection system is normally use with a computer or laptop on a desk or table on site or near the facility. It is usually conducted and real-time controlled by professionals to accurately locate the AE ‘Hits’ sources and analyse the AE data in full aspects. There are two types of AE systems that can be used as desktop type systems, the SAEU3H multi-channel AE system and the RAEM systems respectively.
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High Speed Machinery Test Rigs
designs and builds all kinds of rigs for testing the components of high speed machinery. As in our spin pits, BSi's unsurpassed ability to generate and precisely control extraordinarily high speeds is the key competitive advantage. BSi engineers also draw on our vast experience to provide reliable drives and rigs to meet the most demanding requirements under the most extreme conditions. We have engineered and manufactured rigs for testing bearings at speeds to 250,000 rpm. We have delivered test benches for testing abradable seals at temperatures to 1100 deg. C.
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Test Pattern Generator Software
ScanExpress TPG
To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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SOI Bonding Systems
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection a...show more -
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Dielectric Material Test Fixture
16453A
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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JD Edwards Test Automation
Dimension Swiftest
Dimension SwifTest™ has been designed specifically for EnterpriseOne. It is the easiest way to set up and execute your testing without the need for specialist test engineers or programmers. Business Analysts and Super-Users can now build their own test scripts and scenarios quickly and easily using Dimension SwifTest.
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Universal Imaging System
Laboratory 29 megapixel full spectrum imaging camera package for fingerprint work. A complete digital imaging system providing image capture, image enhancement, and image comparison.
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Custom Systems
ORTEC strives to meet your measurement needs in every aspect. If one of our standard solutions is not the answer, we have the expertise, equipment, and commitment to design and develop robust solutions that satisfy your particular application requirements.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
